The ZEISS Probe CFK M3 is a high-precision probe tip optimized for use on 3D coordinate measuring machines (CMMs). With its specific dimensions (d5/ds3.5/D5/L50/ML41), it enables accurate measurements on complex components. It serves as an indispensable accessory or replacement part for optical and tactile measurement systems to ensure the highest accuracy in industrial metrology. Ideal for users who require precise measurements in quality control, mechanical engineering, or the automotive industry. Order now as a replacement part.
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