The GDG AF test probe is a specific accessory designed as a replacement part for testing devices of the models EPK 13 and AKG 3000 Com. This testing tool is explicitly designed for compatibility with the devices Com 12-001 and Com 12-130. As part of the testing technology, this probe is essential for the correct functioning and accurate measurement results of the mentioned testing devices. The availability of this replacement part ensures the continuous operational readiness of the system.
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